238000000149 argon plasma sintering Methods 0.000 title description 3.239000002245 particle Substances 0.000 title claims description 85.Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.) Filing date Publication date Application filed by Anton Paar GmbH filed Critical Anton Paar GmbH Priority to EP14194341.5A priority Critical patent/EP3023770B1/en Publication of EP3023770A1 publication Critical patent/EP3023770A1/en Application granted granted Critical Publication of EP3023770B1 publication Critical patent/EP3023770B1/en Status Active legal-status Critical Current Anticipated expiration legal-status Critical Links Original Assignee Anton Paar GmbH Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) ( en Inventor Christian Moitzi Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.) Active Application number EP14194341.5A Other languages German ( de)
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#Malvern zetasizer sample position pdf#
Google Patents Determination of a refractive index of a sample and of a particle size of particles in said sample by means of an apparatus for measuring light scatteringÄownload PDF Info Publication number EP3023770B1 EP3023770B1 EP14194341.5A EP14194341A EP3023770B1 EP 3023770 B1 EP3023770 B1 EP 3023770B1 EP 14194341 A EP14194341 A EP 14194341A EP 3023770 B1 EP3023770 B1 EP 3023770B1 Authority EP European Patent Office Prior art keywords electromagnetic radiation sample refraction index optical intensity Prior art date Legal status (The legal status is an assumption and is not a legal conclusion.
![malvern zetasizer sample position malvern zetasizer sample position](http://www.umass.edu/ials/sites/default/files/equipment/malvern-zetasizer-nanozsp.png)
Google Patents EP3023770B1 - Determination of a refractive index of a sample and of a particle size of particles in said sample by means of an apparatus for measuring light scattering EP3023770B1 - Determination of a refractive index of a sample and of a particle size of particles in said sample by means of an apparatus for measuring light scattering